40 CFR Subpart A - Subpart A—Semiconductor Subcategory
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- § 469.10 Applicability.
- § 469.11 Compliance dates.
- § 469.12 Specialized definitions.
- § 469.13 Monitoring.
- § 469.14 Effluent limitations representing the degree of effluent reduction attainable by the application of the best practicable control technology currently available (BPT).
- § 469.15 Effluent limitations representing the degree of effluent reduction attainable by the application of the best available technology economically achievable (BAT).
- § 469.16 Pretreatment standards for existing sources (PSES).
- § 469.17 New source performance standards (NSPS).
- § 469.18 Pretreatment standards for new sources (PSNS).
- § 469.19 Effluent limitations representing the degree of effluent reduction attainable by the application of the best conventional pollution control technology (BCT).